Testing for the programming circuit of LUT-based FPGAs

نویسندگان

  • Hiroyuki Michinishi
  • Tokumi Yokohira
  • Takuji Okamoto
  • Tomoo Inoue
  • Hideo Fujiwara
چکیده

T h e programming circuit o f look-up table based FPGAS consists of two shift registers, a control circuit and a configuration m e m o r y ( S R A M ) cell array. B e cause the configuration m e m o r y cell array can be easily tested by conventional tes t methods f o r R A M S , we f o cus o n testing for the shift registers. W e show that the testing can be done by using only the faculties of the programming circuit, wi thout using additional hardware.

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تاریخ انتشار 1997